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Open Access Research Article

Image Steganalysis with Binary Similarity Measures

İsmail Avcıbaş1*, Mehdi Kharrazi2, Nasir Memon3 and Bülent Sankur4

Author Affiliations

1 Department of Electronics Engineering, Uludağ University, Bursa 16059, Turkey

2 Department of Electrical and Computer Engineering, Polytechnic University, Brooklyn, NY 11201, USA

3 Department of Computer and Information Science, Polytechnic University, Brooklyn, NY 11201, USA

4 Department of Electrical and Electronics Engineering, Boğaziçi University, İstanbul 34342, Turkey

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EURASIP Journal on Advances in Signal Processing 2005, 2005:679350  doi:10.1155/ASP.2005.2749


The electronic version of this article is the complete one and can be found online at: http://asp.eurasipjournals.com/content/2005/17/679350


Received:14 March 2004
Revisions received:10 May 2005
Published:23 October 2005

© 2005 Avcıbaş et al.

We present a novel technique for steganalysis of images that have been subjected to embedding by steganographic algorithms. The seventh and eighth bit planes in an image are used for the computation of several binary similarity measures. The basic idea is that the correlation between the bit planes as well as the binary texture characteristics within the bit planes will differ between a stego image and a cover image. These telltale marks are used to construct a classifier that can distinguish between stego and cover images. We also provide experimental results using some of the latest steganographic algorithms. The proposed scheme is found to have complementary performance vis-à-vis Farid's scheme in that they outperform each other in alternate embedding techniques.

Keywords:
steganography; steganalysis; universal steganalysis

Research Article